Tag Archives: metrology

Configurable multiwavelength narrow linewidth laser system for quantum applications

March 8, 2023 by Modulight Content
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Presented in: SPIE Quantum West 2023 Authors: Kostiantyn Nechay, Luukas Kuusela, Ossi Mäkinen, Riina Ulkuniemi, Pekko Sipilä, Kalle Palomäki, Petteri Uusimaa    Presented in: SPIE Quantum West 2023 Authors: Kostiantyn Nechay, Luukas Kuusela, Ossi Mäkinen, Riina Ulkuniemi, Pekko Sipilä, Kalle Palomäki, Petteri Uusimaa   Single-frequency laser sources serve as a backbone for quantum computing and metrology technologies and applications. Availability of integrated laser systems delivering tailored multiwavelength emission across optical spectrum is a defining factor for further quantum technologies development and commercialization. Modulight demonstrates highly integrated ML6600 laser system for cooling and repumping of 87Rb atoms at D2 line. Such laser system incorporates driving electronics, internal spectroscopy-locked Continue reading →

Modulight releases high-power single-mode lasers at 1310-1650nm for OTDR and other metrology applications

September 16, 2010 by Anca Guina
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Tampere, Finland & San Jose, CA, Sep 16th 2010 – Modulight announced today a set of high-power single lateral mode lasers ideal for optical time-domain reflectometer (OTDR) and other metrology applications. The lasers produce up to 300mW pulsed optical power and cover all conventional wavelengths between 1310 nm and 1650 nm. The products are offered in different formats ranging from laser chips to TO-cans and coaxial PCB mountable fiber pigtailed modules. On request, products can be also integrated into a PCB mountable dual or triple Continue reading →